Inspection and Measurement
MEASUREMENT AND INSPECTION EQUIPMENT
Measurement and Inspection Equipment
HOYA CANDEO OPTRONICS CORPORATION implement the following
measurement and inspection equipment to follow with our QA process according to the needs from the customers.
Our Main Measuring Device / Evaluation Device
Reflected wavefront measurement / Transmitted wavefront measuring device
G102 Fizeau plan interferometer (Fujifilm)
Surface texture measurement
NewView™ 8200 (ZYGO)
Transmitted wavefront measurement
(Shack Hartmann)
SHSInspect (OPTOCRAFT)
X-ray fluorescence spectrometer
EDX 7000 (Shimadzu Corporation)
Transmittance measurement device
UV 3600 Spectrophotometer (Shimadzu Corporation)
Geometry measuring instrument
Shape measuring inspection (Nikon)
Reflectance measurement / Transmittance measurement device
(Variable incident angle/Large specimen/Polarizer 240nm-2600nm)
U 4100 Spectrophotometer (Hitachi)
Infrared transmittance measurement (Fourier transform 1μm-25μm)
Inclusion Analysis
FTS 3000 (Agilent Technologies)
Striae inspection equipment special order (Visible/IR)
Degree of eccentricity
Auto Collimator (Nikon)
Striae inspection equipment special order (UV)
Schlieren striae inspection equipment (Mizojiri Optical)
Optical microscope
Microscope (Nikon)
Laser thermal expansion meter (2nm Minimum resolution)
LIX-2 (Advance Riko)